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  • Diffractometer
    Diffractometer
    1. The accuracy of Diffractometer is high. 2. The application range of Diffractometer is wide. 3. Diffractometer is easy to operate, convenient and efficient.
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  • Single Crystal XRD
    Single Crystal XRD
    1.The single crystal machine adopts PLC control technology. 2.Modular design, accessories plug and play. 3.Electronic lead door interlocking equipment with double protection. 4.Single crystal X-ray tube: a variety of targets can be selected, such as Cu, Mo,etc. 5. Single crystal adopts four-circle concentric technology to ensure that the center of no goniometer remains unchanged.
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  • A 2D X-ray Diffractometer
    A 2D X-ray Diffractometer
    Advantages: Continuously adjustable X-ray penetration depth Capability to observe the distribution of crystal planes with different orientations Analysis of orientation distribution in samples such as fibers, thin films, and powders Examination of structural characteristics like lattice distortion and crystallite size
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  • X-ray Diffraction Residual Stress Analyzer
    X-ray Diffraction Residual Stress Analyzer
    TD-RSD XRD Residual Stress Analyzer ±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.
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XRD Multi-purpose

2024-07-03

1.Forest soil clay minerals - XRD phase analysis

Jilin Agricultural University took forest soil in China as the research object, studied different influencing factors, and used X-ray diffraction analysis method to analyze the X-ray diffraction phase characteristics of clay minerals in different forest soils, and deeply discussed the composition characteristics and content changes of clay minerals in forest soils under different climatic zones and affected by different temperatures and precipitation.

X-ray diffractiondiffraction

2.Quantitative analysis of montmorillonite content and influencing factors by XRD

According to the principle of XRD, its essence lies in crystal diffraction, and the intensity of the diffraction peak is associated with the structure of the crystal and the content of the crystalline substance. Dong Wenhui et al. summarized the approaches and influencing factors for accurately quantifying montmorillonite content by XRD in production practice. There are three primary factors affecting the quantitative analysis of X-ray diffraction: (1) Error arisen from the sample state; (2) Statistical error of the strength measurement software; The error caused by the instrument.

X-ray diffractiondiffraction




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