XRD technology can be used to determine the crystal structure type of the material, such as cubic crystal system, tetragonal crystal system, hexagonal crystal system, etc., while also determining the crystal lattice constant, that is, the unit cell size and geometry of the crystal structure. In addition, XRD can be used to determine the crystal orientation of the material, that is, whether certain crystal faces of the crystal appear preferentially. In addition, through the intensity and location of the diffraction peaks, the content of individual crystal faces in the material can be quantitatively analyzed and the composition of the material can be inferred.
Here is an example of anXRD test on a certain material, resulting in the following pattern:
Open with jade as follows:
The material is ZnO, through the strength and position of the diffraction peak, the content of each crystal face in the material can be quantitatively analyzed, and the composition of the material can be inferred:
The crystal structure type of the material can be determined, while also determining the crystal lattice constant, that is, the crystal structure size and geometry:
