The use of four concentric circles technique ensures that the center of the angle measuring instrument remains unchanged regardless of any rotation, achieving the goal of obtaining the most accurate data and higher completeness. Four concentric circles are a necessary condition for conventional single crystal scanning.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

The X-ray diffraction pattern serves as the most reliable foundation for determining polycrystalline patterns, and the X-ray diffraction pattern is frequently regarded as the "fingerprint" of crystalline patterns.

The crystal structure of the perovskite films modified by ionic liquid (ILs) BMIMAc under various annealing durations was characterized by X-ray diffraction.

X-ray diffraction is a fast, accurate and efficient non-destructive testing technique for materials. As a means of characterizing the crystal structure and its change rule, it is widely used in many fields such as biology, medicine, ceramics and so on.