Recently, Dandong Tongda Science and Technology Co., Ltd.has successfully developed a  multifunctional integrated measuring attachment. This product, characterized by its high precision and multi-functional integration, provides an advanced testing solution for R&D and quality control in fields such as new materials and high-end manufacturing.

The multifunctional integrated measuring attachment is a professional accessory designed to be installed on wide-angle goniometers. It is primarily intended for the analysis of plate-shaped, block-shaped materials, and thin films on substrates. It can perform various complex tasks including crystal phase detection, orientation degree analysis, and stress testing and analysis, demonstrating excellent performance in areas such as material texture analysis, residual stress measurement, and in-plane structural characterization of thin films.

At the core technical level, this attachment achieves flexible integration of measurement methods. It supports pole figure testing using either transmission or reflection methods, and can flexibly select side-inclination or iso-inclination methods for stress testing based on requirements. Its precise mechanical design ensures high measurement accuracy. For instance, the dynamic ranges of its α-axis (tilt) and β-axis (in-plane rotation) reach -45° to 90° and 0° to 360° respectively, with a minimum step as fine as 0.001°. The Z-axis has a minimum step of 0.001mm/step and a movement range of 0~10mm.

The application areas of multifunctional integrated measuring attachment are extensive, covering multiple key stages from fundamental research to industrial production. It can not only be used to evaluate the aggregate structure of rolled metal plates and the orientation of ceramics but also to accurately test the residual stress of various metal and ceramic materials, thereby assessing their wear resistance and machinability. Furthermore, it plays a significant role in cutting-edge fields such as semiconductors and new energy, for example, in analyzing high-temperature superconducting material thin films, multilayer film structures on glass or silicon substrates, among others.

Dandong Tongda Science and Technology Co., Ltd.is a national high-tech enterprise focused on the R&D and production of X-ray analysis and non-destructive testing instruments. Founded in 2010, the company has over 15 years of experience. It has already obtained certification as an SME specializing in refined and unique technologies ("Specialized, Refined, Unique, and Innovative") and has participated as a project undertaking unit in the National Major Scientific Instrument and Equipment Development Project, possessing profound R&D expertise. Currently, the company is in a period of rapid development. Through continuous technological innovation, its products have gained recognition in both domestic and international markets.

The successful development of multifunctional integrated measuring attachment not only reflects Dandong Tongda Science and Technology's technical strength in the field of precision instruments but also contributes to independent innovation and quality enhancement in China's materials science and advanced manufacturing sectors.