In the field of materials science research, precise measurement serves as the key to unlocking material properties. The multi-functional integrated measurement accessory developed by Dandong Tongda Science and Technology Co., Ltd. is a high-precision tool designed to enhance X-ray diffraction analysis capabilities. This multi-functional integrated measurement accessory is specifically designed for installation on wide-angle goniometers. Its core mission is to accurately analyze plate materials, bulk materials, and thin films deposited on substrates. The accessory can perform various measurement tasks, including crystal phase detection, orientation degree analysis, and stress testing. It supports texture analysis, residual stress determination, and in-plane structure testing of thin films, providing comprehensive data support for materials research. The core technical features of this accessory are reflected in its multi-axis coordinated precision mechanical system and highly adaptable measurement methods. The multi-functional integrated measurement accessory supports pole figure measurements using either transmission or reflection methods, offering flexibility for different samples and testing requirements. For stress testing, it can employ both the side-inclination method and the normal-inclination method. For thin film samples, the accessory also enables in-plane rotation testing, allowing for in-depth analysis of film structures. Its precision mechanical system ensures high measurement accuracy and repeatability, with minimum step increments of 0.001° (for rotation axes) and 0.001mm (for translation axes). The application scope of the multi-functional integrated measurement accessory is extremely broad, covering almost all advanced manufacturing and R&D fields that require material structure analysis. In the field of metal materials, it is used for evaluating the collective organization of metals such as rolled plates; in ceramics, it focuses on assessing ceramic orientation. For thin film materials, the accessory can analyze the preferred crystal orientation of film samples and test the residual stress of multilayer films (evaluating properties such as film peeling). It can also analyze surface oxidation and nitridation films on high-temperature superconducting material films and metal plates, as well as multilayer films on glass, silicon, and metal substrates. Notably, it can also be applied to the analysis of macromolecular materials, paper, lens plating materials, and more, demonstrating its interdisciplinary application potential. Measurement Accessory

The multifunctional integrated measurement accessory of X-ray diffractometer (XRD) is a key component for achieving multi scene and multi-scale analysis. Through modular design, it can meet the needs of powder diffraction, small angle scattering, residual stress analysis, in-situ testing, etc. The following are common multifunctional integrated measurement accessories and their core functions: 1. The multifunctional integrated measurement accessory is a temperature and environmental control accessory (1) Function: Supports sample testing under high temperature, low temperature, and humidity control, used to study the crystal structure changes of materials under different temperature or humidity conditions. (2) Characteristics: Temperature range: from room temperature to 1500 ℃; Automatic temperature control and humidity regulation, suitable for in-situ catalysis, phase change analysis and other experiments. (3) Application: Phase transition of metal materials, analysis of polymer crystallinity, research on thermal stability of inorganic materials. 2. Automatic sampler and sample stage for multifunctional integrated measurement accessories (1) Function: Implement automatic switching and precise positioning of multiple samples to improve testing efficiency. (2) Characteristics: Supporting accessories such as sample rotation tables and micro diffraction tables for directional testing of complex samples; Collaborate with intelligent software to optimize measurement parameters and automatically identify sample configurations. (3) Application: Batch sample testing, thin film or micro area analysis. 3. Multi functional integrated measurement accessories suitable for two-dimensional detectors and high-speed one-dimensional detectors (1) Function: Support multi-dimensional data collection to enhance the analysis capability of complex samples. (2) Features: High speed one-dimensional detector, suitable for conventional powder diffraction; Two dimensional semiconductor array detector that can switch between zero dimensional, one-dimensional, or two-dimensional modes, expanding micro area or dynamic in-situ testing capabilities. (3) Application: 2D material crystal orientation analysis, in-situ reaction dynamic monitoring. 4. The multifunctional integrated measurement attachment is a residual stress and micro area diffraction attachment (1) Function: Conduct directional testing on the stress distribution or small areas on the surface of materials. (2) Features: Combining the θ/θ optical system with a microfocus X-ray source to achieve sub millimeter level micro diffraction; Non destructive measurement, used for stress analysis of metal workpieces and semiconductor devices. (3) Application: Fatigue testing of aerospace components, stress characterization of semiconductor thin films. 5. The multifunctional integrated measurement accessory is an intelligent calibration and automation control accessory (1) Function: Ensure testing accuracy and consistency through component recognition and automatic calibration technology. (2) Features: QR code automatic recognition attachment configuration, software guided optimal testing conditions; Fully automatic calibration program to reduce human operation errors. (3) Application: Complex attachment switching (such as high temperature+AXS mode), beginner friendly operation. The accessory design of modern X-ray diffractometers emphasizes modularity, intelligence, and automation. Through software and hardware collaboration, accessories can be quickly switched, parameters optimized, and data standardized. Future trends include higher precision micro area analysis capabilities, integrated solutions for in-situ dynamic testing, and intelligent accessory management systems driven by artificial intelligence.

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy