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News

The R&D project participated by Dandong Tongda was approved

Recently, the Ministry of Science and Technology announced the list of the second batch of key projects under the 2023 National key research and Development Plan "Basic scientific research Conditions and major scientific instruments and equipment research and development".

2024/05/27
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On X-ray absorption fine structure

XAFS, as an advanced characterization technique for the local structure analysis of materials, can provide more accurate atomic structure coordination information in the short-range structure range than X-ray crystal diffraction.

2024/04/10
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X-ray Absorption Fine Structure

X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.

2024/03/18
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Dandong Tongda wishes all goddesses a happy holiday!

Happy Women's Day! On this happy festival,you can have a happy and nice holiday! Enjoy yourself,take easy,and have a rest! Hope you can happy every day ,always have a good temper!

2024/03/08
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Dandong Tongda 2024 New Year Dinner Party

In order to show the good style of Dandong Tongda Company's vigorous development, enhance friendship and enhance cohesion, the company organized a group building activity from January 30 to 31, 2024.

2024/02/02
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Instrument for crystal structure analysis - X-ray diffraction spectrum

X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.

2024/01/24
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Application of X-ray orientation instrument in crystal processing and detection

Automatic X-ray orientation instrument is an indispensable instrument for precision processing and manufacturing crystal devices. It is widely used in the research, processing and manufacturing of crystal materials.

2024/01/23
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About the diffraction pattern

The composition of the diffraction pattern is mainly the position and intensity of the diffraction peak, and our analysis of the XRD pattern is based on the changes in the intensity and position to explain the changes in the micro and macro of the material.

2024/01/17
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About X-ray diffractometer packaging

An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.

2024/01/09
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Introduction to XRD applications - Data quality

As one of the important means of material structure characterization, XRD is widely used in materials, physics, chemistry, medicine and other fields.

2024/01/08
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