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High temperature accessory is designed to understand the changes in the crystal structure of samples during high-temperature heating, as well as the changes in mutual dissolution of various substances during high-temperature heating.  High-temperature accessory play a crucial role as important experimental and industrial equipment in multiple fields. Its wide range of application fields, precise technical parameters, and diverse product types make high-temperature accessory an indispensable part of scientific research and industrial production. technical parameter Temperature setting: Inert gas environment from room temperature to 1200 ℃ Vacuum environment with high temperature of 1600 ℃ Temperature control accuracy: ± 0.5 ℃ Window material: Polyester film

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.

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To understand the changes in crystal structure of samples during high-temperature heating and the changes in mutual dissolution of various substances during high-temperature heating.

The corresponding accessories can be configured for small angle diffraction, and the angle range from 0 ° to 5 ° can be used for thickness testing of nano multilayer films.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, bulk structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, particle size determination, crystallinity determination, etc. of powder, block or film samples.

The X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. It is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science.

Desktop X-ray diffractometer: mainly used for phase analysis of powders, solids, and similar paste materials. It utilizes the principle of X-ray diffraction to perform qualitative or quantitative analysis on polycrystalline materials such as powder samples and metal samples, as well as crystal structure analysis. It is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research.

The TD series crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. Adopting imported PLC control technology, it has high control accuracy and good anti-interference performance, which can achieve reliable operation of this system. PLC controls high voltage switches and lifting. It has the function of automatically training X-ray tubes, effectively extending the service life of X-ray tubes and instruments.

The TD series X-ray crystal analyzer is a large-scale analytical instrument used to study the internal microstructure of materials. It is mainly used for single product orientation, defect inspection, determination of lattice parameters, determination of residual stresses, study of the structure of plates and rods, and investigation of the structure of unknown substances and single crystal dislocations.