Industry news

XRD can measure bulk and powder samples, and has different requirements for different sample sizes and properties.

Global X-ray diffractometer (XRD) has developed steadily in recent years, and China is a market with great development prospects.

Taking deposition scaling as an example, this paper introduces how to use X-ray diffractometer for qualitative phase and quantitative analysis.

The application of new technologies and new products such as 5G, big data, and artificial intelligence will bring a huge semiconductor market demand, and global semiconductor equipment spending has entered an upward cycle.

In recent years, there has been a growing interest in the measurement of high-pressure biological samples. This is reflected in the development of new techniques for pressure measurement that are different from those implemented by DAC. One of them is the technique of freezing crystals under pressure.

High-resolution XRD (HR-XRD) is a common method for measuring the composition and thickness of compound semiconductors such as SiGe, AlGaAs, InGaAs, etc.

X-ray diffractometer (XRD) can be divided into X-ray powder diffractometer and X-ray single crystal diffractometer, the basic physical principle of the two is the same.

Total reflection X-ray fluorescence (TXRF) is a surface element analysis technique commonly used to analyze particles, residues, and impurities on smooth surfaces.

XRD is a means of research which is Diffraction by X-Ray diffraction of a material to analyze its diffraction pattern to obtain information such as the composition of the material, the structure or shape of atoms or molecules inside the material.

Grazing-incidence X-ray diffraction (GI-XRD) is a kind of X-ray diffraction technique, which is different from the traditional XRD experiment, mainly by changing the Angle of X-ray incidence and the orientation of the sample.