The scientific instrumentation field is witnessing a new wave of innovation, as cutting-edge detection technology begins to reshape the future landscape of materials analysis.

In the fields of materials science, chemical research, and industrial quality inspection, X-ray diffractometers have always been indispensable analytical tools. The TD-3700 High-Resolution X-Ray Diffractometer, launched by Dandong Tongda Science and Technology Co., Ltd., is becoming a focus of attention in laboratories worldwide due to its innovative detector technology and versatile scanning modes.

Technological Innovation

As a new member of the TD series, the TD-3700 X-ray diffractometer adopts high-performance one-dimensional array detectors (MYTHEN2R) or SDD detectors.

Compared with traditional scintillation detectors or proportional detectors, this new type of detector can increase diffraction counting intensity by dozens of times.

The TD-3700 X-ray diffractometer can acquire complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity within relatively short sampling periods.

The one-dimensional array detector utilizes hybrid photon counting technology, featuring noiseless operation and rapid data acquisition, with speeds more than ten times faster than scintillation detectors.

The 640-channel detector design provides fast readout times, resulting in an excellent signal-to-noise ratio and effectively eliminating fluorescence effects.

Dual Scanning Modes

The TD-3700 X-ray diffractometer supports not only conventional diffraction data scanning but also transmission data scanning.

The resolution of transmission mode is much higher than that of diffraction mode, making it suitable for fields such as structural analysis, while diffraction mode, due to its stronger diffraction signals, is more suitable for routine phase identification in laboratories.

Transmission mode has another prominent advantage: it requires minimal powder sample quantity, making it ideal for data acquisition when sample amount is insufficient for diffraction mode preparation.

This flexibility enables the TD-3700 X-ray diffractometer to perform excellently across various research scenarios.

Efficient Analysis

In terms of operational convenience, the TD-3700 X-ray diffractometer incorporates one-touch acquisition systems and modular design.

Instrument accessories are plug-and-play, require no calibration, and significantly reduce preparation time.

The modular hardware architecture and customized software systems are perfectly integrated.

The touchscreen real-time online monitoring clearly displays instrument status, making operation more intuitive and straightforward.

Safety and Reliability

The TD-3700 X-ray diffractometer is thoroughly equipped in terms of safety features. The electronic lead door interlock device provides dual protection, ensuring user safety.

The high-frequency high-voltage X-ray generator offers stable and reliable performance, and the advanced recording control unit has strong anti-interference capability.

The triple non-interference isolation protection scheme adopted by the instrument ensures superior overall performance, extremely low failure rate, and extends the machine's service life.

With technological advancement, the requirements for precision and efficiency in materials analysis are increasingly higher. The TD-3700 High-Resolution X-Ray Diffractometer meets the diverse needs of modern laboratories for rapid analysis, convenient operation, and user safety through the perfect combination of modular hardware design and customized software systems.

The TD-3700 X-ray diffractometer not only represents a new height for Chinese scientific instruments but also provides global researchers with more powerful analytical tools, promising to drive materials research across multiple fields towards new milestones.