Dandong Tongda Technology specializes in the development of small-angle diffraction attachments, which are dedicated components for X-ray diffractometers. Covering a diffraction angle range of 0° to 5°, these attachments enable precise measurement of nanoscale multilayer film thickness and support structural analysis of nanomaterials. Designed for seamless compatibility with TD-3500, TD-3700, and other series diffractometers, they are widely used for nanoscale material characterization in fields such as materials science, chemical engineering, geology, and mineralogy. Incorporating imported PLC control technology and modular design, these attachments significantly enhance equipment automation and operational stability. The TD series instruments now meet international standards and have been successfully exported to countries including the United States and Azerbaijan, providing crucial technical support for global nanomaterial research.

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

The goniometer is the heart of the X-ray diffractometer, and the TD series X-ray diffractometer has extremely high measurement accuracy