Hidden experts in the field of measurement

The multifunctional integrated measurement attachment is used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Functional characteristics of multifunctional integrated measurement accessories： Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of samples) Application areas of multifunctional integrated measurement accessories： Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、 Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. Technical specifications for multifunctional integrated measurement accessories： Alpha axis (tilt) minimum step distance: 0.001 °/step, dynamic range:- 45°-90° Minimum step pitch of β axis (rotation): 0.001 °/step, dynamic range: 0 ° -360 ° Minimum step distance on the z-axis: 0.001 °/step, dynamic range: 0-10mm Sample size: maximum diameter of 100mm, adjustable thickness

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