High-Precision X-Ray Crystal Analysis Technology: A Key Tool for Multi-Industry Material Characterization

The TDF series X-ray crystal analyzer delivers exceptional performance in microstructure analysis, supporting single crystal orientation, defect detection, and stress measurement. Featuring a vertical tube design with multi-window operation and imported PLC control, it ensures high precision, safety compliance (radiation <0.1 µSv/h), and adaptability across industries. Backed by ISO certification and global exports, this instrument empowers scientific and industrial advancements worldwide

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Instrument for crystal structure analysis - X-ray diffraction spectrum

X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.

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