X-ray Diffraction Residual Stress Analyzer
TD-RSD XRD Residual Stress Analyzer
±7MPa accuracy, dual-detector innovation, full-auto operation & powerful software. Optimize processes, enhance product reliability. Compact, efficient, leading solution.
- Tongda
- Liaoning, China
- 1—2 months
- 100 units per year
- Information
Exceptional Measurement Accuracy and Stability
The TD-RSD X-ray Diffraction Residual Stress Analyzer employs a 3KW high-power X-ray generator combined with an advanced photon-counting area detector, ensuring reliable data acquisition even under complex working conditions. The instrument demonstrates outstanding performance in stress-free iron powder tests, where the standard deviation of stress over five consecutive measurements is strictly controlled within ±7 MPa—a benchmark that achieves international leading standards.
Innovative Diffraction Geometry Design
Equipped with a unique dual-detector system, the instrument supports:
Dual-detector symmetric ψ (Psi) mode: Optimizes conventional stress measurement workflows.
Dual-detector side-inclination method: Handles samples with complex geometries.
Oscillation technique: Significantly enhances the accuracy of diffraction intensity measurements.
This multi-mode design enables the TD-RSD X-ray Diffraction Residual Stress Analyzer to adapt to various application scenarios, from routine laboratory testing to complex industrial environments.
Precision Mechanical Structure and Intelligent Control System
Precision Motion Control Platform
At the core of the instrument is a meticulously engineered X-ray beam verticality adjustment mechanism, ensuring the X-ray beam maintains an ideal geometric relationship with the sample surface. Coupled with a fully automated computer-controlled goniometer system, users can seamlessly switch between symmetric and side-inclination methods while simultaneously incorporating oscillation, achieving highly flexible measurement modes.
Intelligent Sample Positioning System
Manual/automatic focusing system: Features high-precision laser positioning.
Three-axis sample stage: Capable of generating stress contour maps and computing principal stress magnitude and direction.
Visual operation interface: Enables real-time monitoring of sample position and measurement status.
Core Component Specifications
High-Performance X-Ray Tube
The analyzer utilizes a fine-focus ceramic X-ray tube equipped with a built-in sealed self-circulating cooling system, ensuring the instrument meets stringent requirements for 24/7 continuous operation. Integrated over-temperature automatic protection provides multiple layers of safety. A wide range of target materials, including Cr, Cu, Mn, Co, V, Ti, Fe, Mo, etc., is available to meet the analysis needs of diverse materials.
Advanced Detection System
Configured with two symmetrically arranged high-speed area photon-counting detectors, the system boasts an overall counting rate exceeding 1×10⁹ cps, completely avoiding technical saturation issues common in traditional detectors. The symmetrical installation design not only optimizes spatial layout but also ensures measurement efficiency and accuracy, offering compact size, rapid response, and extremely high sensitivity.
Powerful Analysis Software Capabilities
The dedicated analysis software integrated into the TD-RSD X-ray Diffraction Residual Stress Analyzer includes a comprehensive 3D stress analysis module, supporting:
Ellipse fitting and linear profile fitting algorithms
Accurate resolution of complex stress states
Automatic stress contour mapping
Calculation of principal stress magnitude and direction
Multi-dimensional data visualization
The software features an intuitive and user-friendly interface while providing robust data processing capabilities, effortlessly handling even the most complex stress analysis tasks.
Significant Customer Value
By delivering accurate and reliable residual stress data, the TD-RSD X-ray Diffraction Residual Stress Analyzer helps customers:
Optimize manufacturing process parameters
Enhance product reliability and service life
Reduce product failure risks
Accelerate new product development cycles
Technical Parameter Summary
Overall dimensions: 1300 × 1200 × 1880 mm (compact design saves laboratory space)
Power configuration: 3 KW (balancing performance and energy efficiency)
Measurement accuracy: ±7 MPa (industry-leading level)
Detector configuration: Dual photon-counting area detectors
Control system: Fully automated computer-controlled operation
With its exceptional technical performance, reliable quality assurance, and comprehensive after-sales support, the TD-RSD X-ray Diffraction Residual Stress Analyzer is becoming the preferred equipment in the global materials analysis field. Whether you are engaged in cutting-edge scientific research or focused on industrial quality control, the TD-RSD provides the most professional solutions.
To learn more about the product or schedule a demonstration, please contact the professional technical team at Dandong Tongda Science and Technology Co., Ltd.
