background

New Force in X-Ray Diffraction

2025-11-21 09:22

A high-end scientific instrument developed in China — the TD-3500 X-Ray Diffractometer — is injecting new vitality into the global analytical instrument industry with its exceptional performance and technological innovation. The instrument has been implemented in numerous international laboratories, serving as a reliable tool for researchers exploring the microscopic world of materials.

01 Technological Breakthrough: Advanced PLC Control System

The core innovation of the TD-3500 X-Ray Diffractometer lies in its adoption of an imported Siemens PLC (Programmable Logic Controller).

This advanced control system replaces traditional single-chip microcomputer circuits, significantly reducing instrument failure rates while enhancing operational stability.

Compared to conventional single-chip solutions used in the industry, the PLC control system offers distinct advantages including simplified circuitry, easier debugging, and straightforward installation. Users can perform maintenance and calibration without requiring manufacturer technicians on-site, substantially improving equipment usability.

02 Exceptional Performance: Foundation for Precision Measurement

The TD-3500 X-Ray Diffractometer demonstrates outstanding performance metrics. Its goniometer utilizes imported high-precision bearing transmission, with motion control managed by a high-accuracy fully closed-loop vector drive servo system.

The instrument achieves remarkable 2θ angle repeatability of 0.0001 degrees with an identical minimum step angle, ensuring highly accurate and reliable measurement results.

Featuring a standard scanning radius of 225mm (adjustable from 150-325mm) and a scanning range covering -110° to 161° (transmission mode), it accommodates diverse testing requirements for various complex samples.

03 Extensive Applications: Versatile Analytical Solution for Multiple Industries

The TD-3500 X-Ray Diffractometer primarily serves for qualitative and quantitative phase analysis, crystal structure analysis, and material structure analysis of powder, bulk, or thin-film samples.

Additional capabilities include crystal orientation analysis, macro/micro-stress measurement, grain size determination, and crystallinity assessment.

Addressing specific industry requirements, Tongda Technology has developed specialized measurement programs. For titanium dioxide manufacturers, the company created a dedicated TiO₂ content measurement program that performs three consecutive scans on four sample types — ilmenite, rutile titanium dioxide, anatase titanium dioxide, and imported titanium slag — delivering rutile measurement results with an error margin below 0.2%.

04 Safety Design: Dual Protection Mechanism

Safety constitutes a fundamental design priority for the TD-3500 X-Ray Diffractometer. The instrument incorporates an electronic lead door interlock system providing dual protection.

The safety shutter automatically closes when the lead door opens, ensuring operator safety.

A unique high-voltage safety mechanism further protects operators by automatically reducing voltage when the lead door opens. The X-ray leakage rate remains below 0.12 μSv/h, significantly exceeding international safety standards.

Dandong Tongda Science and Technology Co., Ltd. reaffirms its commitment to the development philosophy of "Advancing Enterprise Through Technology, Strengthening Through Innovation," continuing to optimize products and market strategies to promote sustainable development of Chinese scientific instruments in the global marketplace.

X-Ray Diffraction

Get the latest price? We'll respond as soon as possible(within 12 hours)
This field is required
This field is required
Required and valid email address
This field is required
This field is required