TD-3700 High-Resolution X-Ray Diffractometeris a flagship analytical instrument designed for modern materials laboratories. It integrates high precision, rapid analysis, exceptional stability, and user-friendliness, providing comprehensive structural information for various solid samples including powders, bulk materials, and thin films.

 Core Advantages

The breakthrough of TD-3700 lies in its high-performance detector system. Compared to traditional scintillation or proportional detectors, its standard high-speed 1D array detector or optional SDD detector can enhance diffraction signal intensity by tens to hundreds of times. This technology enables the instrument to obtain diffraction patterns with higher sensitivity, resolution, and signal-to-noise ratio in extremely short acquisition times, significantly reducing experimental cycles and enhancing efficiency in both research and quality control.

The instrument supports both reflection and transmission scanning modes, offering unique application flexibility. Reflection mode provides strong signals, suitable for routine phase identification, while transmission mode delivers higher resolution and is particularly ideal for crystal structure analysis. Transmission mode requires minimal sample amounts, effectively addressing the challenges of analyzing trace or difficult-to-prepare samples.

Key Technical Specifications

Wide Application Areas

The powerful analytical capabilities of TD-3700 make it an indispensable tool in the following areas:

Phase Analysis: Qualitative and quantitative analysis of unknown materials.

Structure Determination: Precise measurement of lattice parameters, crystal orientation, grain size, and crystallinity.

Stress Measurement: Analysis of macro- and micro-stresses within materials.

Industry Coverage: Widely used in chemicals, petroleum, energy, electronics, batteries, building materials, and cutting-edge scientific research.

In summary, TD-3700 High-Resolution X-Ray Diffractometer, with its revolutionary detection speed, ultra-high measurement accuracy, flexible analysis modes, and robust reliability, is committed to providing trusted material structural solutions for researchers and engineers worldwide.

Dandong Tongda Science and  Technology Co., Ltd. is a national high-tech enterprise specializing in the R&D, manufacturing, and technical services of high-end material analysis instruments such as X-ray diffractometers. We serve the global semiconductor, new energy, and industrial quality inspection sectors with precision detection technology. If you have any needs, feel free to contact us anytime!