Precision measuring equipment produced by Dandong Tongda Science & Technology Co,.Ltd. is steadily entering the global market. Its core product, the X-ray crystal orienter, with a positioning accuracy of ±30 arcseconds and a maximum load capacity of 30 kilograms, plays a key role in global crystal material research and processing, providing reliable technical support for material science research and industrial production.

Working Principle

Based on X-ray diffraction theory, this orienter can rapidly and accurately determine the cutting angles of natural and artificial single crystal materials.

The equipment can be used in conjunction with various cutting devices and is widely applied in the precise orientation cutting of piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. It has become indispensable key equipment in the precision manufacturing process of crystal devices.

To meet the diverse needs of different customers, Dandong Tongda Technology has developed multiple models of crystal orienter product series.

The TYX-200 X-ray Crystal Orienter has a positioning error not exceeding ±30 arcseconds, features a digital display interface, and offers a minimum reading accuracy of 10 arcseconds.

The upgraded model TYX-2H8 incorporates comprehensive optimizations to the goniometer structure based on the base model. It adds a load-bearing track, X-ray tube sleeve, and support system, while also raising the sample stage height. It can handle various samples weighing 1 to 30 kilograms with diameters from 2 to 8 inches.

Technical Advantages

This series of instruments features user-friendly operational characteristics, allowing operators to get started quickly even without a specialized background in crystallography.

The digital angle display interface makes the observation process more intuitive, effectively avoiding human reading errors. The display device supports zeroing at any position, facilitating direct reading of the wafer's angle deviation value.

The dual goniometer system enables simultaneous operation, significantly improving inspection efficiency. Equipped with a specialized integrator featuring peak amplification function, it further optimizes detection accuracy.

In terms of hardware configuration, the X-ray tube and high-voltage cable adopt an integrated design, enhancing the stability of the high-voltage system. The detector high-voltage part utilizes DC high-voltage module technology, combined with a vacuum adsorption sample platform, comprehensively improving the accuracy and efficiency of angle measurement.

Application Scope

In scientific research, X-ray crystal orienters have become an important tool for material analysis.

Their application scope covers several key fields including piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. These devices play vital roles in fundamental research, process development, and manufacturing processes of crystal materials, vigorously promoting the advancement of materials science.

The TYX-2H8 model, specifically designed for sapphire materials, can meet the measurement requirements for various sapphire orientations like A, C, M, and R. Its measurement range is 0~45° with electric automatic adjustment, and it can support measurements of crystal lumps weighing up to 30~180 kilograms, greatly expanding the equipment's application field.

Professional Configurations

To address the specific requirements of different application scenarios, Dandong Tongda Technology has developed various dedicated sample stage configurations.

The TA Series Sample Stage is specifically designed for cylindrical crystals, equipped with a dedicated load-bearing track capable of handling crystal rod materials weighing 1-30 kilograms with diameters of 2-6 inches (expandable to 8 inches).

The TB Series Sample Stage adds V-shaped support rails based on the TA type, enabling the measurement of crystal rods up to 500 millimeters in length. This model's goniometer also supports end-face measurement of rod-shaped crystals.

The TC Series Sample Stage is primarily suitable for detecting the outer circumference reference surface of single crystal wafers like silicon and sapphire. The X-ray reception area on its suction platform adopts an open structural design, effectively solving the technical problems of traditional suction plates blocking X-rays and inaccurate positioning.

The TD Series Sample Stage focuses on the multi-point measurement needs of wafers like silicon and sapphire. The wafer can be manually rotated and positioned on the sample stage, supporting multiple standard angular positions such as 0°, 90°, 180°, and 270°, fully meeting users' special inspection requirements for wafer characteristics.

With the continuous growth in global demand for precision measuring equipment driven by technological advancement,  Dandong Tongda Science & Technology Co,.Ltd. , relying on its innovative technical concepts, stable product performance, and comprehensive after-sales service system, is gradually earning widespread recognition for Chinese-made precision instruments in the international market.