In the field of modern technology, many high-tech products—from smartphone screen substrates to core components of laser generators—rely on a fundamental material: synthetic single crystals. The precision of the cutting angle of these crystals directly determines the performance and yield of the final products. The X-Ray Orientation Analyzer is an indispensable instrument in the precision manufacturing of crystal devices. Utilizing the principle of X-ray diffraction, it accurately and rapidly measures the cutting angles of both natural and synthetic single crystals, including piezoelectric crystals, optical crystals, laser crystals, and semiconductor crystals. Dandong Tongda Science and Technology Co., Ltd. offers a range of reliable X-Ray Orientation Analyzers tailored to the research, processing, and manufacturing needs of the crystal materials industry. 01 Versatile Machine for Diverse Crystal Orientation Needs Dandong Tongda's X-Ray Orientation Analyzers primarily include models such as the TYX-200 and TYX-2H8. The TYX-200 model boasts a measurement accuracy of ±30″, with a digital display and a minimum reading of 10″. The TYX-2H8 model is an improved version of the TYX-200, featuring enhancements in the goniometer structure, load-bearing track, X-ray tube sleeve, support body, and an elevated sample stage. These improvements enable the TYX-2H8 to handle samples weighing 1–30 kg with diameters of 2–8 inches. It retains a digital angle display and a measurement accuracy of ±30″. 02 Advanced Technical Features for User-Friendly Operation Dandong Tongda's X-Ray Orientation Analyzers are designed with practicality and reliability in mind. Their user-friendly operation requires no specialized knowledge or advanced skills from the operator. The instrument features a digital angle display, ensuring intuitive and easy-to-read measurements while minimizing the risk of misreading. The display can be zeroed at any position, allowing direct reading of the wafer angle deviation. Some models are equipped with dual goniometers for simultaneous operation, significantly improving detection efficiency. A special integrator with peak amplification enhances measurement accuracy. The X-ray tube and high-voltage cable adopt an integrated design, improving high-voltage reliability. The detector high-voltage system uses a DC high-voltage module, and the vacuum suction sample stage further enhances measurement accuracy and speed. 03 Dedicated Sample Stage Designs for Various Testing Needs To meet the measurement requirements of samples with different shapes and sizes, Dandong Tongda offers a variety of specialized sample stages: TA Sample Stage: Designed for rod-shaped crystals, it features a load-bearing track and can test crystal rods weighing 1–30 kg with diameters of 2–6 inches (expandable to 8 inches). This stage can measure reference surfaces of rod-shaped crystals as well as surfaces of wafer-shaped crystals. TB Sample Stage: Also designed for rod-shaped crystals, it includes a load-bearing track and V-shaped support rails. It can test crystal rods weighing 1–30 kg, with diameters of 2–6 inches (expandable to 8 inches) and lengths of up to 500 mm. It measures end faces of rod-shaped crystals and surfaces of wafer-shaped crystals. TC Sample Stage: Primarily used for detecting the outer reference surfaces of single-crystal wafers such as silicon and sapphire. Its open-design suction plate avoids X-ray obstruction and positioning inaccuracies. The stage's suction pump securely holds wafers sized 2–8 inches, ensuring precise detection. ​ TD Sample Stage: Designed for multi-point measurements of wafers such as silicon and sapphire. Wafers can be manually rotated on the stage (e.g., 0°, 90°, 180°, 270°) to meet specific customer measurement needs. 04 High-Performance Model for Large Sample Challenges For large and challenging sample detection, Dandong Tongda's X-Ray Orientation Analyzers demonstrate exceptional performance. The TYX-2H8 model, for example, is particularly suitable for orienting sapphire crystal ingots and rods. This instrument supports measurements of sapphire A, C, M, and R crystal orientations, with an adjustable measurement range of 0–45° via electric automation. Its technical specifications are impressive: Copper-target X-ray tube with grounded anode and forced air cooling. Adjustable tube current: 0–4 mA; tube voltage: 30 kV. Operation via computer or touchscreen control. Synchronized movement of the X-ray tube and detector; electric-driven rotary table. Total power consumption: ≤2 kW. Most notably, its sample handling capacity includes crystal ingots weighing up to 30–180 kg, with maximum dimensions of 350 mm in diameter and 480 mm in length. These capabilities make it suitable for large sample detection in most industrial scenarios. 05 Broad Applications Supporting Multiple Industries Dandong Tongda's X-Ray Orientation Analyzers are widely used across various industries involved in the research, processing, and manufacturing of crystal materials. In the semiconductor industry, they enable precise orientation cutting of silicon wafers. In the optoelectronics field, they are used for precision processing of sapphire substrates, optical crystals, and laser crystals. In the piezoelectric materials sector, they ensure accurate cutting angle measurements for stable end-product performance. The instruments are particularly well-suited for sapphire materials, which are in high demand due to their hardness, high light transmittance, and excellent physicochemical stability. Sapphire is widely used in LED substrates, consumer electronic screens, and optical windows. Dandong Tongda's X-Ray Orientation Analyzers have become essential tools in China's crystal material research and manufacturing fields, thanks to their reliable performance, diverse configurations, and strong adaptability. Their modular design and variety of sample stage options allow users to select configurations that meet specific needs, ensuring high detection accuracy while improving work efficiency. Whether for research institutions or manufacturing quality control and process optimization, these instruments provide robust technical support, empowering users to achieve breakthroughs in precision manufacturing.

Dandong Tongda's X-ray Crystal Analyzer adopts advanced X-ray diffraction technology, enabling non-destructive detection of microstructural information in various materials. Whether it's single crystal orientation, defect inspection, lattice parameter measurement, or residual stress analysis, this instrument provides accurate and reliable test data, offering solid support for material research and quality control. The instrument is equipped with a highly stable X-ray generator that delivers exceptional performance. The tube voltage can be precisely adjusted within the range of 10-60kV, and the tube current can be regulated from 2-60mA, with a stability of no more than ±0.005%. This ensures highly repeatable and accurate test results, providing researchers with dependable data assurance. Dandong Tongda's X-ray Crystal Analyzer integrates intelligent control and comprehensive safety protection. It features an imported PLC automatic control system, enabling unattended automatic timed measurements. The multi-level safety protection system includes no-pressure, no-current, over-voltage, over-current, over-power, no-water, and X-ray tube over-temperature protections, ensuring the safety of operators. The TDF series X-ray crystal analyzer adopts a vertical tube housing with four windows that can be used simultaneously. It utilizes imported PLC control technology, which offers high precision and strong anti-interference capabilities, ensuring the reliable operation of the system. The PLC controls the switching and adjustment of high voltage and includes an automatic training function for the X-ray tube, effectively extending the service life of both the X-ray tube and the instrument. The instrument's radiation protection enclosure is constructed with high-density, high-transparency leaded glass, with external radiation leakage far below national safety standards, allowing researchers to conduct experimental studies in a secure environment. As a national high-tech enterprise, Dandong Tongda Technology Co., Ltd. has a comprehensive quality management system and a technical R&D team. Its products not only meet domestic market demands but are also exported to numerous countries and regions, demonstrating the strength and capability of China's scientific instrument manufacturing. Dandong Tongda's X-ray Crystal Analyzer, with its outstanding performance and reliable quality, has become a powerful assistant in the field of material analysis. It helps researchers and engineers unveil the layers of the material world and explore more unknown possibilities.

In the fields of materials science and industrial testing, every minute change in crystal structure can determine the final properties of a material. Today, a precision instrument embodying the essence of R&D from Dandong Tongda Science and Technology— TD-3500 X-ray Diffractometer—is opening a new window into the microscopic world for researchers and industrial inspectors with its outstanding performance and intelligent design. Evolution Through Craftsmanship and Technology The TD series diffractometers incorporate years of technological accumulation from Tongda Science and Technology, continuously evolving with the times. As the "gold standard" for material analysis, X-ray diffraction technology enables comprehensive structural analysis of powder, bulk, or thin-film samples: from qualitative and quantitative phase analysis, crystal structure analysis, and material structure analysis, to orientation analysis, macro/micro stress measurement, grain size, and crystallinity determination—the TD-3500 does it all. Intelligent Core, Stable and Reliable The core advantage of the TD-3500 X-ray Diffractometer lies in its use of an imported Siemens PLC control system. This innovative design gives the instrument outstanding features such as high precision, high accuracy, excellent stability, long service life, easy upgradability, user-friendly operation, and intelligent functionality, enabling it to flexibly adapt to the testing and research needs of various industries. The X-ray generator offers two options: high-frequency high-voltage solid-state or工频(line-frequency) generators, with high automation, extremely low failure rates, strong anti-interference capabilities, and excellent system stability. The system automatically controls the shutter switch, adjusts tube voltage and current, and includes an automatic X-ray tube training function. Real-time monitoring via a touchscreen greatly reduces operational complexity. Innovative Control, Revolutionary Operation Compared to traditional single-chip microcomputer circuits, the PLC control technology used in the TD-3500 offers multiple breakthroughs: Simple circuit control for easy debugging and installation Modular design allows users to perform maintenance and debugging themselves, significantly reducing costs Strong expandability for easy addition of various functional accessories without hardware modifications True-color touchscreen for human-machine interaction, user-friendly operation, and intuitive fault information display Precision Measurement, Safety Assured The TD series goniometer uses imported high-precision bearing transmission and is equipped with a high-precision full closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, capable of automatically correcting minute movement position errors to ensure high precision and accuracy of measurement results, with angular reproducibility reaching 0.0001 degrees. For safety, the TD-3500 adopts a hollow-axis structure with electronic lead door interlock装置, providing dual protection. The shutter window is linked to the lead door—when the lead door opens, the shutter automatically closes, ensuring comprehensive operator safety. Flexible Configuration, Comprehensive Compatibility The instrument offers two detector choices—proportional counter (PC) or scintillation counter (SC)—and multiple X-ray tube options including glass, corrugated ceramic, and metal-ceramic tubes, meeting different application scenarios and budget requirements. The TD-3500 X-ray Diffractometer is not only a high-performance analytical instrument but also a reflection of Tongda Science and Technology's relentless pursuit of quality. It is quietly playing a vital role in laboratories across the country, supporting scientific innovation and quality control, and becoming the most trusted analytical partner for scientists and engineers. Whether you are engaged in new material development, mineral resource analysis, pharmaceutical quality control, or metal material testing, the TD-3500 can provide you with accurate and reliable data support, helping you discover more possibilities in the microscopic world. Explore the Unknown with TD-3500—Let Tongda Science and Technology work with you to uncover the mysteries of materials science.

In the fields of materials science and industrial inspection, highly efficient and precise X-ray diffraction analysis has always been a core support for scientific breakthroughs and quality control. The TD-3700 series X-ray diffractometer redefines the performance limits of diffraction equipment with multiple innovative technologies, providing an unprecedented efficient solution for academic research, corporate R&D, and quality control applications. Multi-Detector Synergy Ushers in a New Era of High-Speed Analysis The TD-3700 series breaks through the limitations of traditional detectors by offering a variety of options, including high-speed one-dimensional array detectors, two-dimensional detectors, and SDD detectors. Compared to conventional scintillation or proportional detectors, it increases diffraction signal intensity by dozens of times, capturing high-sensitivity, high-resolution diffraction patterns within extremely short sampling cycles and significantly improving data output efficiency. Coupled with hybrid photon counting technology, the detectors operate noise-free, effectively suppress fluorescence background, and demonstrate excellent energy resolution and signal-to-noise performance—making them particularly suited for analyzing complex samples and trace specimens. Dual Diffraction/Transmission Modes Expand Application Boundaries The instrument not only supports conventional diffraction scanning but also innovatively introduces a transmission mode. This mode offers significantly higher resolution than diffraction mode, making it especially suitable for high-end applications such as crystal structure analysis and nanomaterials research. Meanwhile, diffraction mode, with its ultra-high signal stability, is ideal for routine phase identification. Another major advantage of transmission mode is its support for trace sample testing, greatly alleviating the challenges of sample preparation and limited sample availability. This opens up new possibilities for pharmaceutical development, geological analysis, cultural heritage identification, and other fields. Modular and Intelligent Design for a Reliable and User-Friendly Experimental Platform The TD-3700 adopts a modular hardware design where all components are plug-and-play without requiring calibration, significantly reducing maintenance costs and failure rates. Its one-click acquisition system and customized software greatly enhance operational convenience, allowing even non-specialists to get started quickly. A touchscreen interface provides real-time monitoring of instrument status, making experimental progress clear at a glance. Safety is also uncompromised: an electronic lead door interlock device offers dual protection, while a high-frequency high-voltage X-ray generator ensures stable and reliable performance. Combined with an anti-interference control unit, it maintains long-term operational reliability while ensuring user safety. Born for the Era: A Future-Oriented Benchmark in Diffraction Technology The TD-3700 series X-ray diffractometer integrates rapid analysis, intelligent operation, and comprehensive safety. It not only inherits the stability of the TD-3500 series but also achieves breakthroughs in detector technology, application flexibility, and system integration. Its emergence greatly meets the needs of modern laboratories for high-throughput, high-precision, and diverse sample analysis, making it an indispensable tool for material characterization, chemical analysis, pharmaceuticals, and academic research.

The TDM-20 X-ray Diffractometer​ (Benchtop XRD) is primarily used for phase analysis of powders, solids, and paste-like substances. Based on the principle of X-ray diffraction, it enables qualitative and quantitative analysis, as well as crystal structure analysis, of polycrystalline materials like powdered samples and metal samples. It is widely applied in industries including industry, agriculture, national defense, pharmaceuticals, mineralogy, food safety, petroleum, and education/research. Core Principle: X-ray Diffraction, the Key to the Microscopic World The TDM-20 X-ray Diffractometer operates on the principle of X-ray diffraction. When X-rays illuminate a sample, they interact with the atoms in the sample and diffract. Different crystal structures produce unique diffraction patterns, much like individual fingerprints. By analyzing these patterns, the instrument precisely reveals key information about the sample's crystal structure, phase composition, and more, uncovering the secrets hidden at the microscopic level. Performance Breakthrough The TDM-20 X-ray Diffractometer (Benchtop XRD) surpasses the previous international standard of 600W, undergoing a comprehensive upgrade to 1600W. The instrument features simple operation, stable performance, and low energy consumption. It can be equipped with either a proportional detector or a new high-speed array detector, resulting in a significant leap in overall performance. Device Features ​Compact size and lightweight design High-frequency, high-voltage power supply design for lower overall energy consumption Supports rapid sample calibration and testing Simplified circuit control for easy debugging and installation Full-spectrum diffraction angle linear accuracy reaches ±0.01° Rich Accessories Compatible with various accessories including a 1D array detector, proportional detector, 6-position automatic sample changer, and rotating sample stage. Conclusion The TDM-20 X-ray Diffractometer, with its outstanding performance, user-friendly operation, and broad range of applications, has become an indispensable tool across numerous industries and research fields. It acts like a "detective" of the microscopic world, helping us unravel the mysteries of material structure and driving progress in various domains. If you too seek to delve deeper into the microscopic secrets of matter, consider the TDM-20 to embark on a journey of precise and efficient research and production.

Originally battery accessories are experimental devices designed specifically for electrochemical testing, mainly used for in-situ characterization of battery materials during charging and discharging processes, commonly found in X-ray diffraction (XRD). 1. Core functions and application scenarios of originally battery accessories (1)Originally testing: Real time monitoring of material phase structure changes (such as crystal structure and phase transition) during battery charging and discharging can avoid sample contamination or state changes caused by battery disassembly. Support multiple electrochemical systems, including composites containing carbon, oxygen, nitrogen, sulfur, metal embedment, etc. (2) Multimodal compatibility: X-ray diffraction (XRD): used to analyze the structural evolution of positive/negative electrode materials during charge and discharge processes. 2. Structural composition and technical characteristics of originally battery accessories (1) Key components: Lower insulation cover: usually made of alumina ceramic or polytetrafluoroethylene material, containing coolant flow channels or resistance wire installation pipelines, used for temperature control. Upper conductive cover: connected to the lower insulating cover by bolts to form a closed space, with a beryllium window (diameter 15mm, thickness 0.1mm) at the top to transmit X-rays. Electrode system: originally battery accessories includes a lower electrode (with a support column) and a butterfly spring, which are electrically connected through compression fixation, simplifying the assembly process. (2) Technological innovation: Formal design: Compared with the traditional inverted method, the formal structure does not require flipping assembly, making it easy to operate in the glove box and ensuring the flatness of the beryllium window and diaphragm. Sealing and temperature control: Integrated coolant circulation pipeline and resistance wire heating device, suitable for a temperature range of -400 ℃ to 400 ℃. 3. Technical advantages of originally battery accessories (1) Simplified operation: Reduce assembly steps, decrease operating time inside glove boxes, and improve efficiency. The butterfly spring fixes the electrode without the need for rotation and tightening, avoiding interference with the simulated structure of the battery. (2) Performance improvement: The high X-ray transmittance (>90%) of beryllium windows ensures the detection signal strength. The multifunctional sample stage supports automatic sample changing and is suitable for high-throughput testing. Overall, originally battery accessoriesare important tools for electrochemical research, as their design optimizes the assembly process of traditional battery simulation structures and enhances the reliability and applicability of originally testing.

A multifunctional sample stage is an experimental or testing platform that integrates multiple functional modules, used to carry, manipulate, and test different types of samples (such as materials, biological samples, electronic components, etc.). It usually has flexible configuration and scalability to meet different experimental needs, and is widely used in scientific research, industrial testing, medical and other fields. 1. Core functions and features of multifunctional sample stage (1) Multi dimensional adjustment of multifunctional sample stage Motion control: Supports precise movements such as X/Y/Z axis translation, rotation, and tilt, and is compatible with automatic scanning or manual fine-tuning. Environmental simulation: It can integrate modules such as temperature control (-196 ° C to several thousand degrees), humidity control, vacuum/atmosphere environment (such as inert gas, corrosive gas), etc. Force/electric/magnetic loading: Some models support the application of mechanical force, current, magnetic field, etc., used to study the performance of samples under extreme conditions. (2) Compatibility and Scalability of Multi functional Sample Stand Adapt to multiple analytical instruments Modular design allows users to add functions according to their needs, such as heating stations, cooling stations, fluid infusion systems, etc. (3) High precision and stability of multifunctional sample stage Nano level displacement accuracy, anti vibration design, suitable for in-situ observation or long-term experiments. Some models support in-situ characterization (such as real-time observation of sample changes during stretching, compression, and heating processes). (4) Automation and Intelligence of Multi functional Sample Stand Automated testing is achieved by controlling motion trajectories and environmental parameters through software. Integrated sensors and data acquisition system, real-time recording of sample reactions (such as deformation, resistance changes, etc.). 2. Typical application scenarios of multifunctional sample table: (1) Materials Science of Multi functional Sample Stand Study the performance of materials in high/low temperature, stress, and corrosive environments. In situ SEM/TEM observation of material deformation, phase transformation, or crystallization processes. (2) Biomedical multifunctional sample stage Cell culture and drug permeation experiments require temperature control, humidity control, and gas environment. Cooperate with microscopic imaging to observe the dynamic changes of living samples. (3) Electronics and Semiconductors for Multi functional Sample Stand Chip testing: Provides functions such as probe positioning, thermal shock, and electrical performance testing. Sample positioning and processing in photolithography or coating processes. (4) Chemical/Energy Research on Multi functional Sample Stand In situ monitoring of catalytic reactions (such as surface reactions under illumination and heating conditions). Battery electrode testing (simulating expansion/contraction during charging and discharging processes).

The multifunctional integrated measurement accessory of X-ray diffractometer (XRD) is a key component for achieving multi scene and multi-scale analysis. Through modular design, it can meet the needs of powder diffraction, small angle scattering, residual stress analysis, in-situ testing, etc. The following are common multifunctional integrated measurement accessories and their core functions: 1. The multifunctional integrated measurement accessory is a temperature and environmental control accessory (1) Function: Supports sample testing under high temperature, low temperature, and humidity control, used to study the crystal structure changes of materials under different temperature or humidity conditions. (2) Characteristics: Temperature range: from room temperature to 1500 ℃; Automatic temperature control and humidity regulation, suitable for in-situ catalysis, phase change analysis and other experiments. (3) Application: Phase transition of metal materials, analysis of polymer crystallinity, research on thermal stability of inorganic materials. 2. Automatic sampler and sample stage for multifunctional integrated measurement accessories (1) Function: Implement automatic switching and precise positioning of multiple samples to improve testing efficiency. (2) Characteristics: Supporting accessories such as sample rotation tables and micro diffraction tables for directional testing of complex samples; Collaborate with intelligent software to optimize measurement parameters and automatically identify sample configurations. (3) Application: Batch sample testing, thin film or micro area analysis. 3. Multi functional integrated measurement accessories suitable for two-dimensional detectors and high-speed one-dimensional detectors (1) Function: Support multi-dimensional data collection to enhance the analysis capability of complex samples. (2) Features: High speed one-dimensional detector, suitable for conventional powder diffraction; Two dimensional semiconductor array detector that can switch between zero dimensional, one-dimensional, or two-dimensional modes, expanding micro area or dynamic in-situ testing capabilities. (3) Application: 2D material crystal orientation analysis, in-situ reaction dynamic monitoring. 4. The multifunctional integrated measurement attachment is a residual stress and micro area diffraction attachment (1) Function: Conduct directional testing on the stress distribution or small areas on the surface of materials. (2) Features: Combining the θ/θ optical system with a microfocus X-ray source to achieve sub millimeter level micro diffraction; Non destructive measurement, used for stress analysis of metal workpieces and semiconductor devices. (3) Application: Fatigue testing of aerospace components, stress characterization of semiconductor thin films. 5. The multifunctional integrated measurement accessory is an intelligent calibration and automation control accessory (1) Function: Ensure testing accuracy and consistency through component recognition and automatic calibration technology. (2) Features: QR code automatic recognition attachment configuration, software guided optimal testing conditions; Fully automatic calibration program to reduce human operation errors. (3) Application: Complex attachment switching (such as high temperature+AXS mode), beginner friendly operation. The accessory design of modern X-ray diffractometers emphasizes modularity, intelligence, and automation. Through software and hardware collaboration, accessories can be quickly switched, parameters optimized, and data standardized. Future trends include higher precision micro area analysis capabilities, integrated solutions for in-situ dynamic testing, and intelligent accessory management systems driven by artificial intelligence.

The TDM-10 desktop X-ray diffractometer is a compact and high-precision phase analysis device. The following is a detailed introduction to the product: 1. Core functions and applications of TDM-10 desktop X-ray diffractometer (1) Phase analysis Suitable for qualitative and quantitative analysis of powder, solid, paste like materials, and thin film samples, it can identify the crystal structure, phase composition, and crystallinity in the samples. (2) Crystal structure analysis It can measure grain size, crystal orientation, macroscopic/microscopic stress, and structural properties of materials. (3) Industrial and Research Applications Widely used in fields such as geology, materials science, chemistry, biology, medicine, and nuclear industry, suitable for rapid laboratory testing and teaching demonstrations. 2. Technical characteristics of TDM-10 desktop X-ray diffractometer (1) Compact design and efficient performance Small size, light weight, low power consumption, easy to operate, suitable for desktop environments. Equipped with high-frequency and high-voltage power supply, the power can reach 1600W (refer to TDM-20 model), ensuring X-ray stability. (2) High precision measurement The measurement accuracy of diffraction peak position reaches 0.001 °, with excellent angular repeatability, meeting the requirements of high-precision analysis. By using the principles of Debye Scherrer geometry and Bragg's law, the crystal reflection signal is recorded through conical surface diffraction, achieving accurate phase identification. (3) Intelligent Control and Data Processing Computer controlled data acquisition, supporting real-time data acquisition and processing under Windows system, with an intuitive operating interface. Can be paired with array detectors (referring to the high-performance detector technology of TDM-20) to improve detection efficiency and sensitivity. 3. Applicable scenarios of TDM-10 desktop X-ray diffractometer (1) Research field Universities and research institutes are used for material research and development, crystal structure analysis, and characterization of nanomaterials. (2) Industrial applications Mineral identification, drug composition analysis, food safety testing (such as crystal impurity screening), etc. (3) Teaching Demonstration Easy to operate desktop device, suitable for student experimental teaching, covering the basic theory and practical operation of phase analysis. 4. Technical parameters of TDM-10 desktop X-ray diffractometer (1) Measurement accuracy: diffraction peak position accuracy of 0.001 ° (2) Control method: Computer control (Windows system) (3) Power supply: Low power design, high-frequency high-voltage power supply (4) Detector: Supports array detectors or proportional detectors (refer to TDM-20 accessories) (5) Sample stand: can be paired with a rotating sample stand or an automatic sample changer (optional accessory) 5. Product advantages of TDM-10 desktop X-ray diffractometer (1) High cost-effectiveness: Domestic equipment has outstanding performance and is much cheaper than imported equipment, making it suitable for laboratories with limited budgets. (2) Quick detection: Optimize calibration process, shorten testing time, and improve experimental efficiency. (3) Scalability: Supports multiple accessories (such as low-temperature cooling systems, in-situ battery accessories, etc.), which can be extended to special scenario analysis. 6. Related series and comparison of TDM-10 desktop X-ray diffractometer TDM-20 model: TDM-20 is an upgraded version of TDM-10, with higher power (1600W), new high-performance array detectors, support for automatic sample changers and other accessories, suitable for more complex industrial and scientific research needs. Other models: The Dandong Tongda TD series also includes high-resolution diffraction instruments such as TD-3500 and TD-3700, as well as TDF series crystal analyzers, covering multidimensional analysis needs. The TDM-10 desktop X-ray diffractometer has become the preferred equipment for laboratory phase analysis due to its compact design, high-precision measurement, and intelligent operation. It has a wide range of application scenarios, especially suitable for scientific research and industrial environments that require fast and accurate detection. If higher configuration is required, TDM-20 or other models in the same series can be considered.

X-ray irradiator is a scientific research equipment that uses X-rays to irradiate biological samples, materials, or small animals, and is widely used in fields such as biology, medicine, and materials science. 1. Core functions and technical principles of X-ray irradiation equipment (1) Functional positioning Biological research: used for DNA damage, cell mutagenesis, stem cell differentiation induction, tumor mechanism research, immunology and gene therapy experiments, etc. Medical applications: radiation disinfection, blood product processing, analysis of tumor cell apoptosis, pre-treatment for organ transplantation, etc. Materials and Environmental Science: Nanomaterial Modification, Food Radiation Quarantine, Soil Pollutant Analysis, etc. (2) Technical principles By accelerating electrons with high voltage to collide with metal targets, X-rays are generated; After optimization through filters, beam limiting devices, etc., the sample is irradiated to achieve targeted intervention by precisely controlling the dose rate, irradiation time, and range. 2. Key technical parameters of X-ray irradiation equipment (1) Radiation performance Tube voltage: 30-225kV (different models vary). Dose rate: 0.1-16Gy/minute, supporting precise and stepless adjustment. Dose uniformity: ≥ 95% (industry-leading level). Radiation angle and coverage area: The maximum radiation angle is 40 degrees, and the coverage diameter is up to 30cm. (2) Operation and Safety Design Intelligent control: touch screen operation interface, data export function (compatible with Excel). Safety protection: lead shielded cabinet, environmental dose<20 μ R/h (5cm away from equipment), multiple interlocks and fault alarms. Cooling system: Closed loop cooling technology extends the lifespan of X-ray tubes (up to 2000 hours). (3) Applicable sample types Cells, tissue organs, bacteria, mice, rats, etc., support irradiation of small animals in a conscious or anesthetized state. 3.Typical products and manufacturers of X-ray irradiation equipment Domestic representative: Dandong Tongda Technology Co., Ltd Advantages: Localization reduces procurement costs, simplifies operations (without the need for complex X-ray knowledge), and meets national safety standards. 4. Expansion of application fields for X-ray irradiation equipment (1) Biology and Medicine Cell research: inducing gene mutations, cell cycle regulation, signal transduction analysis. Tumor research: irradiation of tumor cell models to explore apoptosis mechanisms or radiation sensitivity. Preclinical studies: Whole body irradiation of small animals (such as mice) for research on hematopoietic system, immune response, etc. (2) Materials and Environmental Science Nanomaterial modification: changing the crystal structure or surface properties of materials through irradiation. Food quarantine: Non destructive detection of foreign objects, residual preservatives, or microbial inactivation. Nuclear waste disposal: Assist in analyzing the distribution of radioactive materials to ensure safe disposal. (3) Agriculture and Breeding Mutation breeding: Irradiating plant seeds or insects to accelerate gene mutations and screen for superior traits. 5. Development trends and challenges of X-ray irradiation equipment (1) Technical upgrade direction Intelligence: Combining AI algorithms to optimize dose distribution and experimental design. Safety: Reduce environmental radiation leakage and improve protection standards. Multi functional integration: such as integrating CT imaging and irradiation functions to achieve "detection processing" integration. (2) Industry challenges High precision dose control and stability require continuous optimization. More basic data is needed to support the differences in radiation sensitivity among biological samples. Overall, X-ray irradiation equipment is an indispensable tool in scientific research and industry. The X-ray irradiation equipment produced by Dandong Tongda Technology Co., Ltd. achieves a balance between performance and cost and is widely used in multiple fields. In the future, with technological iteration, its application scope will further expand to cutting-edge directions such as precision medicine and new material research and development.

1. TDF series X-ray crystal analyzer Function and Application: This series of equipment is mainly used to study the internal microstructure of materials, suitable for single crystal orientation, defect inspection, lattice parameter determination, residual stress analysis, plate/rod structure research, unknown material structure analysis, and single crystal dislocation analysis. Technical features: As a large-scale analytical instrument, the TDF series integrates high-precision X-ray diffraction technology, which can provide deep analysis of microstructures and support research and quality control in fields such as materials science, semiconductor manufacturing, and crystal processing. The TDF series X-ray crystal analyzer adopts a vertical tube sleeve, and four windows can be used simultaneously. The TDF series X-ray crystal analyzer adopts imported PLC control technology, with high control accuracy and good anti-interference performance, which can achieve reliable operation of the system. The PLC controls the high-voltage switch, lifting, and has the function of automatically training the X-ray tube, effectively extending the service life of the X-ray tube and instrument. 2. X-ray crystal orienter Function and application: By using the principle of X-ray diffraction, the cutting angle of natural or artificial single crystals (such as piezoelectric crystals, optical crystals, laser crystals, semiconductor crystals) can be quickly and accurately determined. When combined with a cutting machine, directional cutting can be achieved. Widely used in the research, processing, and manufacturing industries of crystalline materials. Technical advantages: It can replace traditional radioactive isotope irradiation technology and directly complete high-precision directional analysis in the laboratory, improving crystal processing efficiency and accuracy.

The TDM-20 desktop X-ray diffractometer is a compact desktop device mainly used for material phase analysis and crystal structure research. 1. The core functions of TDM-20 desktop X-ray diffractometer Phase analysis of TDM-20: TDM-20 can perform qualitative/quantitative analysis on polycrystalline samples such as powders, solids, and paste materials. Crystal structure analysis of TDM-20: Based on the principle of X-ray diffraction, TDM-20 supports the analysis of crystal structures of metal samples, minerals, compounds, etc. 2. Technical characteristics of TDM-20 desktop X-ray diffractometer The high power and performance of TDM-20: using high-frequency high-voltage power supply, the power is increased to 1600W. Equipped with new high-speed array detectors or proportional detectors to improve data acquisition efficiency and accuracy. Convenient operation of TDM-20: The device is small in size and light in weight, suitable for compact laboratory spaces; Supports fast calibration and testing, with simple circuit control and easy installation and debugging. The accuracy and stability of TDM-20: the angle repeatability is as high as 0.0001 °, and the full spectrum diffraction angle linearity is ± 0.01 °. Scalability of TDM-20: TDM-20 can be equipped with a 6-digit automatic sample changer, a rotating sample stage, a low-temperature cooling system, and in-situ high/medium low temperature accessories to meet diverse testing needs. 3. Application scenarios of TDM-20 desktop X-ray diffractometer The research fields of TDM-20 include crystal structure characterization and phase transition analysis in materials science, geology, and pharmaceutical research. Industrial applications of TDM-20: pharmaceutical industry drug consistency assessment, mineral identification, petrochemical catalyst analysis, food safety testing (such as crystal composition determination). Education and National Defense of TDM-20: Rapid Phase Identification in University Teaching Experiments and National Defense Material Development. 4. Manufacturers and accessories of TDM-20 Manufacturer: Dandong Tongda Technology Co., Ltd. Optional accessories: one-dimensional array detector, proportional detector, 6-digit automatic sample changer, rotating sample stage, graphite bent crystal monochromator, etc. Overall, TDM-20, with its high power, high precision, and compact design, has become an efficient tool for laboratory phase analysis and is widely used in scientific research, industry, and teaching fields.