Products

thin film attachment enables precise XRD analysis of nanometer/micrometer films, ideal for semiconductors, coatings and polymers. It enhances signal, reduces substrate interference and supports high-speed scanning, widely used in R&D and quality control with TD series diffractometers.

1. The biological x ray irradiator does not require professional knowledge of X-ray operation. 2. The biological x ray irradiator does not require additional X-ray shielding requirements. 3. The biological x ray irradiator is automatically preheated to prolong the service life of the ray tube.

The portable X-ray residual stress analyzer is a non-destructive testing device based on X-ray diffraction technology. It is primarily used for measuring surface and near-surface residual stress distribution in materials such as metals and plastics, combining high precision with field adaptability.

PLC control system;Modular design, easy operation, and more stable equipment performance Lightweight design: Lightweight, suitable for rapid on-site measurement; High-precision measurement: High-precision full-closed-loop vector drive servo system control; Simple operation: Integrated Windows system or automation functions, supports one-click testing and real-time result display; Multi-functional compatibility: Measuring carbon steel, alloy steel, titanium alloy and other metals, glass, nickel-based materials and various composite materials; Speed optimization: Multi-channel silicon microstrip line array detector can provide noise-free performance, high-intensity measurement and rapid data acquisition.

XAFS Spectrometer achieves synchrotron-level data quality with >4M photons/s/eV flux, <0.1% stability, and a 1% detection limit. It empowers research across energy, catalysis, and materials science.

Polarographic testing using transmission or reflection Stress testing can be performed using the tilt method or the same tilt method. Thin film testing (in-plane rotation of the sample)

1. Maximum output powder: 1200W 2. Detector Type: Array detector or SDD detector, all of types detectors can be adapted to on this mode. 3. PLC automatic control calculus, Integration method conversion, PLC automatically performs PHA, dead time correction

1. Detector type: Array detector or SDD detector; 2. PLC automatic control calculus, Integration mode conversion, PLC automatically performs PHA, dead time correction 3.Sample measurement type: powder sample, liquid samples, melt-state samples, viscous samples, loose powders, bulk solid samples 4.Available with a variety of diffractometer accessories 5.Maximum output powder: 3kW

Thin film measuring accessory from Dandong Tongda Technology enhances performance by incorporating longer grating sheets. This design effectively filters out scattered radiation, reducing interference from substrate signals while significantly strengthening the thin film diffraction signals.

The AI fully automated X-ray diffractometer deeply integrates the high-precision manipulation of a robotic arm based on a portable diffractometer. Compared to traditional diffractometers, it significantly reduces manual intervention, making it suitable for R&D scenarios requiring high-throughput and high-repeatability testing. It can be remotely controlled via mobile phone or APP, featuring automatic door opening and closing technology. With autonomous sampling and analysis capabilities, it offers precision and convenience.