X-ray absorption fine structure spectrometer is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology.
XAFS core advantages:
Highest luminous flux product:
Photon flux exceeding 1000000 photons/second/eV, with spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation
Excellent stability:
The stability of monochromatic light intensity of the light source is better than 0.1%, and the energy drift during repeated collection is less than 50 meV
1% detection limit:
High luminous flux, excellent optical path optimization, and excellent light source stability ensure high-quality EXAFS data is obtained even when the measured element content is>1%。
1.
Instrument principle
2.test data
3.Measurable elements: The green part can measure the K side, and the yellow part can measure the L side
4.application area
